Publications

08/06/2013
Antonio Cardone, Peter Bajcsy, John T. Elliott, YaShian Li-Baboud, Joe Chalfoun
Abstract:

We introduce a methodology for microscopy settings assessment and segmentation accuracy prediction based on image quality descriptors.

Description:

YaShian Li-Baboud; Antonio Cardone; Joe Chalfoun; Peter Bajcsy; John T. Elliott; SPIE Newsroom; August 06, 2013 http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913788


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